Lumetrics receives new patent method allowance for measuring contact lenses

March 07, 2018 Posted by Lumetrics

 

Lumetrics was granted a patent allowance for the technology used to measure a contact lens using the ClearWave plus. This patent allowance works in tandem with two previous patent filings that Lumetrics was awarded concerning the apparatus of measurement.

The ClearWave Plus uses a modified ClearWave in combination with the industry standard OptiGauge thickness measurement system. This provides contact lens manufacturers center thickness (CT), Sagittal Height (SAG), diameter, radius of curvature, and all the wavefront measurements that currently require three separate systems to obtain.
Lumetrics is the leading provider of ophthalmic related measurement solutions as the ClearWave & OptiGauge systems have been implemented in the world’s leading contact lens manufacturers R&D laboratories and production facilities. The ClearWave Plus provides the best of these products in a single operator friendly solution that results in less handling of the contact lens. The ClearWave Plus has been designed for fast and accurate screening of contact lenses.

http://blog.lumetrics.com/new-patent-method-allowed

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